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1

A comparison of algorithms for data base compression by use of fragments as language elements

E.J. Schuegraf, H.S. Heaps

Journal:

Information Storage and Retrieval

Year:

1974

Language:

english

File:

PDF, 797 KB

english, 1974

2

Hole injection SiO2 breakdown model for very low voltage lifetime extrapolation

Schuegraf, K.F., Chenming Hu

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 723 KB

english, 1994

3

Metal-oxide-semiconductor field-effect-transistor substrate current during FowlerâNordheim tunneling stress and silicon dioxide reliability

Schuegraf, Klaus F., Hu, Chenming

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 887 KB

english, 1994

4

An analysis of personal journal subscriptions of university faculty. Part I. science

Ernst J. Schuegraf, Liam T. Keliher, Martin F. van Bommel

Journal:

Journal of the American Society for Information Science and Technology

Year:

1992

Language:

english

File:

PDF, 846 KB

english, 1992

5

An analysis of personal journal subscriptions of university faculty. Part II. Arts and professional programs

Ernst J. Schuegraf, Martin F. van Bommel

Journal:

Journal of the American Society for Information Science and Technology

Year:

1994

Language:

english

File:

PDF, 605 KB

english, 1994

6

Selection of equifrequent word fragments for information retrieval

E.J. Schuegraf, H.S. Heaps

Journal:

Information Storage and Retrieval

Year:

1973

Language:

english

File:

PDF, 720 KB

english, 1973

7

Compression of large inverted files with hyperbolic term distribution

Journal:

Information Processing & Management

Year:

1976

Language:

english

File:

PDF, 772 KB

english, 1976

8

Semiconductor Logic Technology Innovation to Achieve Sub-10 nm Manufacturing

Schuegraf, Klaus, Abraham, Mathew C., Brand, Adam, Naik, Mehul, Thakur, Randhir

Journal:

IEEE Journal of the Electron Devices Society

Year:

2013

Language:

english

File:

PDF, 7.24 MB

english, 2013

9

[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - Hole injection oxide breakdown model for very low voltage lifetime extrapolation

Schuegraf, K.F., Hu, C.

Year:

1993

Language:

english

File:

PDF, 354 KB

english, 1993

10

[IEEE 1993 International Symposium on VLSI Technology, Systems, and Applications Technical Papers - Taipei, Taiwan (12-14 May 1993)] 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers - Impact of polysilicon depletion in thin oxide MOS technology

Schuegraf, K.F., King, C.C., Hu, C.

Year:

1993

Language:

english

File:

PDF, 261 KB

english, 1993

11

Hochreines Germanium – Oberflächenleitung und Trägerlebensdauer

F. Aurich, H. P. Kleinknecht, A. Renz, K. Schuegraf, K. Seiler

Journal:

Annalen der Physik

Year:

1963

Language:

german

File:

PDF, 1.07 MB

german, 1963

12

Über die Reaktion zwischen Azobenzol-Chlorhydrat und aromatischen Kohlenwasserstoffen. (II. Mitteilung.)

Rudolf Pummerer, Josef Binapfl, Karl Bittner, Karl Schuegraf

Journal:

European Journal of Inorganic Chemistry

Year:

1922

Language:

german

File:

PDF, 513 KB

german, 1922

13

Metallkatalytische Spaltung von Phosphoproteiden1)

Eugen Bamann, Heinz Trapmann, Auguste Schuegraf

Journal:

European Journal of Inorganic Chemistry

Year:

1955

Language:

german

File:

PDF, 318 KB

german, 1955

14

Halogensubstitutionsprodukte des Thyronins (Desjod-thyroxins)

Journal:

Helvetica Chimica Acta

Year:

1929

Language:

german

File:

PDF, 590 KB

german, 1929

15

Determination of the number of unambiguous bit matrices

Sergei Aalto, Ernst Schuegraf

Journal:

International Journal of Parallel Programming

Year:

1977

Language:

english

File:

PDF, 480 KB

english, 1977

16

Integrated circuits: Memory grows up

Pirovano, Agostino, Schuegraf, Klaus

Journal:

Nature Nanotechnology

Year:

2010

Language:

english

File:

PDF, 184 KB

english, 2010

17

Fortran IV program to compute pearson's frequency curves

E.J. Schuegraf, E.L. Zodrow

Journal:

Computers & Geosciences

Year:

1975

Language:

english

File:

PDF, 472 KB

english, 1975

18

Query processing in a retrospective document retrieval system that uses word fragments as language elements

E.J. Schuegraf, H.S. Heaps

Journal:

Information Processing & Management

Year:

1976

Language:

english

File:

PDF, 892 KB

english, 1976

19

Effects of temperature and defects on breakdown lifetime of thin SiO2 at very low voltages

Schuegraf, K.F., Chenming Hu

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 613 KB

english, 1994

20

Hermetically sealed silicon chip diodes and transistors

Langdon, J.L., Mutter, W.E., Pecoraro, R.P., Schuegraf, K.K.

Journal:

IRE Transactions on Electron Devices

Year:

1962

Language:

english

File:

PDF, 188 KB

english, 1962

21

Design Approach to Radiation-Hardened I2L Gate Arrays

Bahraman, Ali, Chang, Stephen, Romeo, Donald, Schuegraf, Klaus

Journal:

IEEE Transactions on Nuclear Science

Year:

1978

Language:

english

File:

PDF, 2.14 MB

english, 1978

22

Radiation Effects on Bipolar Integrated Injection Logic

Raymond, J. P., Wong, T. Y., Schuegraf, K. K.

Journal:

IEEE Transactions on Nuclear Science

Year:

1975

Language:

english

File:

PDF, 1.22 MB

english, 1975

23

Radiation-Hardened Performance-Optimized I2L LSI

Bahraman, A., Chang, S., Romeo, D., Schuegraf, K., Wong, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1977

Language:

english

File:

PDF, 1.18 MB

english, 1977

24

Finding Bilateral Agreement: The Rules of the Game

Oliver Schuegraf

Journal:

The Ecumenical Review

Year:

2003

Language:

english

File:

PDF, 558 KB

english, 2003

25

Schottky-base I/sup 2/L: a high-performance LSI technology

Bahraman, A., Chang, S.Y.S., Romeo, D.E., Schuegraf, K.K.

Journal:

IEEE Journal of Solid-State Circuits

Year:

1979

Language:

english

File:

PDF, 1.20 MB

english, 1979

26

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Epi defined (ED) FinFET: An alternate device architecture for high mobility Ge channel integration in PMOSFET

Mittal, S., Gupta, S., Nainani, A., Abraham, M.C., Schuegraf, K., Lodha, S., Ganguly, U.

Year:

2013

Language:

english

File:

PDF, 1.40 MB

english, 2013

27

[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - Textured AZO on silicon oxy-nitride barrier films for enhanced light trapping in micromorph tandem junction solar cells

Bhatnagar, Yashraj, McComb, Brendan, Tang, Jianshe, Subramani, Mani, Wang, Wei D, Zhang, Hong, Wang, Stanley, Hsu, Terence, Severin, Daniel, Schuegraf, Klaus, Ponnekanti, Hari

Year:

2010

Language:

english

File:

PDF, 2.15 MB

english, 2010

28

Reliability of thin SiO 2

Schuegraf, K F, Hu, Chenming

Journal:

Semiconductor Science and Technology

Year:

1994

Language:

english

File:

PDF, 1.05 MB

english, 1994

29

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Ultra high speed SiGe NPN for advanced BiCMOS technology

Racanelli, M., Schuegraf, K., Kalburge, A., Kar-Roy, A., Shen, B., Hu, C., Chapek, D., Howard, D., Quon, D., Wang, F., U'ren, G., Lao, L., Tu, H., Zheng, J., Zhang, J., Bell, K., Yin, K., Joshi, P., A

Year:

2001

Language:

english

File:

PDF, 282 KB

english, 2001

30

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Is strain engineering scalable in FinFET era?: Teaching the old dog some new tricks

Nainani, Aneesh, Gupta, Shashank, Moroz, Victor, Choi, Munkang, Kim, Yihwan, Cho, Yonah, Gelatos, Jerry, Mandekar, Tushar, Brand, Adam, Ping, Er-Xuan., Abraham, Mathew C., Schuegraf, Klaus

Year:

2012

Language:

english

File:

PDF, 641 KB

english, 2012

31

$RC$ Performance Evaluation of Interconnect Architecture Options Beyond the 10-nm Logic Node

Kincal, Serkan, Abraham, Mathew C., Schuegraf, Klaus

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 1.41 MB

english, 2014

32

[IEEE 1999 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (26-28 Sept. 1999)] Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.99CH37024) - BC35: a 0.35 μm, 30 GHz production RF BiCMOS technology

Racanelli, M., Zhe Zhang,, Jie Zheng,, Kar-Roy, A., Joshi, P., Kalburge, A., Nathawad, L., Todd, M., Ukah, C., Chun Hu,, Compton, G., Schuegraf, K., Peihua Ye,, Dowlatshahi, R., Jolly, G., Kempf,

Year:

1999

Language:

english

File:

PDF, 388 KB

english, 1999

33

Epitaxially Defined FinFET: Variability Resistant and High-Performance Technology

Mittal, Sushant, Gupta, Shashank, Nainani, Aneesh, Abraham, Mathew C., Schuegraf, Klaus, Lodha, Saurabh, Ganguly, Udayan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.08 MB

english, 2014

34

A comparison of swimming structures and kinematics in three species of crustacean larvae

Ford, Matthew D., Schuegraf, Monica J., Elkink, Meghan S., Edwin DeMont, M.

Journal:

Marine and Freshwater Behaviour and Physiology

Year:

2005

Language:

english

File:

PDF, 322 KB

english, 2005

35

[IRE 1961 International Electron Devices Meeting - ()] 1961 International Electron Devices Meeting - Hermetically sealed silicon chip diodes and transistors

Langdon, J.L., Mutter, W.E., Pecoraro, R.P., Schuegraf, K.K.

Year:

1961

Language:

english

File:

PDF, 62 KB

english, 1961

36

Transistor wars

K. Ahmed, K. Schuegraf

Journal:

Year:

2011

Language:

english

File:

PDF, 15.51 MB

english, 2011

37

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Gate stack reliability improvements using controlled ambient processing

Schuegraf, K.F., Thakur, R.P.S., Weirner, R.

Year:

1997

Language:

english

File:

PDF, 460 KB

english, 1997

38

[IEEE 1992 Symposium on VLSI Technology Digest of Technical Papers - Seattle, WA, USA (2-4 June 1992)] 1992 Symposium on VLSI Technology Digest of Technical Papers - Ultra-thin silicon dioxide leakage current and scaling limit

Schuegraf, K.F., King, C.C., Hu, C.

Year:

1992

Language:

english

File:

PDF, 168 KB

english, 1992

39

[IEEE 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (30 Sept.-2 Oct. 2001)] Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212) - 0.18 μm SiGe BiCMOS technology for wireless and 40 Gb/s communication products

Schuegraf, K., Racanelli, M., Kalburge, A., Shen, B., Chun Hu,, Chapek, D., Howard, D., Quon, D., Feiler, D., Dornisch, D., U'Ren, G., Abdul-Ridha, H., Jie Zheng,, Jinshu Zhang,, Bell, K., Ring, K.

Year:

2001

Language:

english

File:

PDF, 317 KB

english, 2001

40

[IRE 1964 International Electron Devices Meeting - ()] 1964 International Electron Devices Meeting - Silicon monolithic random pulse generator

Wang, L., Robertson, H., Schuegraf, K.K.

Year:

1964

Language:

english

File:

PDF, 1012 KB

english, 1964

41

[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - Effects of temperature and defects on breakdown lifetime of thin SiO/sub 2/ at very low voltages

Schuegraf, K.F., Chenming Hu,

Year:

1994

Language:

english

File:

PDF, 745 KB

english, 1994

42

[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Reliability of thin SiO/sub 2/ at direct-tunneling voltages

Schuegraf, K.F., Donggun Park,, Chenming Hu,

Year:

1994

Language:

english

File:

PDF, 359 KB

english, 1994

43

[IEEE 20th European Microwave Conference, 1990 - Budapest, Hungary (1990.10.4-1990.10.6)] 20th European Microwave Conference, 1990 - Tracking System for Satellite Ground Station Antennas with Field-Selective Coupling of TE01 and TM01 Modes

Year:

1990

Language:

english

File:

PDF, 469 KB

english, 1990

44

[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - Oxide Breakdown Model For Very Low Voltages

Schuegraf,, Chenming Hu,

Year:

1993

Language:

english

File:

PDF, 183 KB

english, 1993

45

Single-wafer process technology: enabling rapid SiGe BiCMOS development

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2003

Language:

english

File:

PDF, 470 KB

english, 2003

46

[IEEE 2012 70th Annual Device Research Conference (DRC) - University Park, PA, USA (2012.06.18-2012.06.20)] 70th Device Research Conference - Epitaxialy defined (ED) FinFET: to reduce VT variability and enable multiple VT

Mittal, S., Gupta, S., Nainani, A., Abraham, M.C., Schuegraf, K., Lodha, S., Ganguly, U.

Year:

2012

Language:

english

File:

PDF, 1.40 MB

english, 2012

47

Ein Millimeterwellen-Modulator nach dem Prinzip der Faraday-Drehung zur Erzeugung kurzer Impulse

Journal:

Year:

1966

Language:

german

File:

PDF, 2.05 MB

german, 1966

48

Eine Ringmeßleitung mit rotierendem Abtaster für den 5-mm-Wellenbereich

Journal:

Year:

1965

Language:

german

File:

PDF, 1.73 MB

german, 1965

49

Eine Polarisationsweiche mit symmetrischer Anregung der H11-Wellen

Journal:

Year:

1960

Language:

german

File:

PDF, 844 KB

german, 1960

50

Ein Überlagerungsempfänger für Millimeterwellen

Journal:

Year:

1966

Language:

german

File:

PDF, 1.40 MB

german, 1966